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公司地址
苏州工业园区生物纳米园A4#216
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4000-520-616 / 18915418616
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0512-67156496
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什么是原子力显微镜 (AFM)原子力显微镜 (AFM)是一种高分辨率非光学成像技术，由 Binnig、Quate 和 Gerber 于 1985 年首次展示 [1]。从那时起，它已发展成为一种强大的表面分析测量工具。AFM 允许在空气、液体或超高真空中以非常高的分辨率 [2] 对样品表面的形貌、电、磁、化学、光学、机械等特性进行准确和无损测量。这种独特的功能组合使 AFM 在世界上最先进的科学和技
NanoAndMore公司新闻
Cantilever: F: 330 kHz C: 40 N/m L: 125 µmApplications: Nanoindentation and Lithography AFM ProbesSphere AFM TipsLife Science AFM ProbesDescription: Controlled radius, pre-calibrated cantilever: spherical AFM tip with a radius of 500 nm for hig...
2018-03-26
阅读量(2)
Cantilever: F: 75 kHz C: 3 N/m L: 225 µmApplications: Conductive AFM ProbesDescription: Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:scanning capacitance microscopy (SCM)electrostatic...
2018-04-23
阅读量(0)
Cantilever: F: 320 kHz C: 42 N/m L: 125 µmApplications: High Aspect Ratio (HAR) AFM ProbesDescription: NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation sta...
2018-05-21
阅读量(1)
Applications: Tipless AFM Cantilevers and Cantilever ArraysDescription: NanoWorld Pyrex-Nitrid probes are designed for various imaging applications in contact or dynamic mode. Tipless cantilevers are often used for applications that require functiona...
2018-06-16
阅读量(0)
Applications: Tipless AFM Cantilevers and Cantilever ArraysDescription: Probes of the 37/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications. Uncoated AFM Ti...
2018-07-07
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Cantilever: F: 130 kHz C: 15 N/m L: 225 µmApplications: Non-Contact / Soft Tapping Mode AFM ProbesDescription: The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application ver...
2018-07-09
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Cantilever: F: 13 kHz C: 0.2 N/m L: 450 µmApplications: Conductive AFM ProbesDescription: Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as scanning capacitance microscopy (SCM).The rotate...
2018-08-07
阅读量(0)
Cantilever: F: 25 kHz C: 0.2 N/m L: 225 µmApplications: Contact Mode AFM ProbesDescription: NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with res...
2018-08-26
阅读量(2)
Applications: Fluid Tapping AFM ProbesLife Science AFM ProbesConductive AFM ProbesDescription: The 3XC series features three different cantilevers for various measurement modes:500DC - Contact mode cantilever200AC - Standard AC mode cantilever240AC -...
2019-01-01
阅读量(2)
Cantilever: F: 13 kHz C: 0.2 N/m L: 450 µmApplications: Contact Mode AFM ProbesDescription: The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compat...
2019-01-01
阅读量(0)
NanoAndMore商品列表
| 货号 | 图片 | 产品名 | 品牌 | 价格 | 货期 | 货期 |
|---|---|---|---|---|---|---|
| SSS-NCHR-50 |
|
nanoandmore/SSS-NCHR/SSS-NCHR-50/盒50个AFM探针 | NanoAndMore | ￥31530.24 | 3-4周 |
我要询价 立即购买 |
| 240AC-FG-5 |
|
nanoandmore/240AC-FG/240AC-FG-5/盒5个AFM探针 | NanoAndMore | ￥13200.00 | 3-4周 |
我要询价 立即购买 |
| HQ:NSC36/tipless/NoAl-100 |
|
nanoandmore/HQ:NSC36/tipless/No Al/HQ:NSC36/tipless/No Al-100/Box of 100 AFM Probes | NanoAndMore | ￥18360.00 | 3-4周 |
我要询价 立即购买 |
| TipCheck |
|
NanoAndMore/Tipcheck AFM Tip Characterizer Calibration Standard - NanoAndMore/TipCheck | NanoAndMore | ￥2160.00 | 3-4周 |
我要询价 立即购买 |
