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0512-67156496
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什么是原子力显微镜 (AFM)原子力显微镜 (AFM)是一种高分辨率非光学成像技术，由 Binnig、Quate 和 Gerber 于 1985 年首次展示 [1]。从那时起，它已发展成为一种强大的表面分析测量工具。AFM 允许在空气、液体或超高真空中以非常高的分辨率 [2] 对样品表面的形貌、电、磁、化学、光学、机械等特性进行准确和无损测量。这种独特的功能组合使 AFM 在世界上最先进的科学和技
NanoAndMore公司新闻
Cantilever: F: 70 kHz C: 2 N/m L: 240 µmApplications: Non-Contact / Soft Tapping Mode AFM ProbesForce Modulation (FM) AFM ProbesDescription: The OLTESPA is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip ap...
2016-08-11
阅读量(0)
Applications: Life Science AFM ProbesForce Modulation (FM) AFM ProbesFluid Tapping AFM ProbesDescription: Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various appli...
2017-03-12
阅读量(1)
Cantilever: F: 15 kHz C: 0.2 N/m L: 450 µmApplications: Conductive AFM ProbesDescription: NANOSENSORS™ AdvancedTEC™ ContPt AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very...
2017-09-12
阅读量(2)
8 Vollstadt Diamant GmbH 相关业务和产品:人造金刚石等。 9 Custodiam 相关业务和产品:单晶金刚石、金刚石微粉(磨料)、复合片、多晶金刚石、天然金刚石、树脂结合金刚石产品等。 10 IIa Technologies Pte Ltd ...
2024-03-15
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Cantilever: F: 75 kHz C: 2.8 N/m L: 225 µmApplications: Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM ProbesDescription: NanoWorld PointProbe® FM probes are designed for force modulation mode imaging. The force constan...
2018-01-09
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Cantilever: F: 11 kHz C: 0.01 N/m L: 125 µmApplications: Colloidal AFM ProbesSphere AFM TipsDescription: The new sQube® colloidal probe combines the well-known features of the proven qp-SCONT probes series such as high application versatili...
2018-01-12
阅读量(6)
Cantilever: F: 25 kHz C: 0.2 N/m L: 225 µmApplications: Contact Mode AFM ProbesLateral Force Mode AFM Probes (LFM)Description: The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high ...
2018-01-27
阅读量(2)
Cantilever: F: 210 kHz C: 72 N/m L: 225 µmApplications: Hardened / Enhanced Wear Resistance AFM ProbesDiamond AFM ProbesNanoindentation and Lithography AFM ProbesHardened / Enhanced Wear Resistance Tapping AFM ProbesDescription: NanoWorld Point...
2018-02-21
阅读量(1)
Applications: Contact Mode AFM ProbesDescription: Probes of the 38 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications. Uncoated AFM Tip: shape: Rotated height: 15 µ...
2018-03-01
阅读量(2)
Cantilever: F: 190 kHz C: 48 N/m L: 225 µmApplications: Plateau AFM TipsDescription: The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-...
2018-03-12
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NanoAndMore商品列表
| 货号 | 图片 | 产品名 | 品牌 | 价格 | 货期 | 货期 |
|---|---|---|---|---|---|---|
| SSS-NCHR-50 |
|
nanoandmore/SSS-NCHR/SSS-NCHR-50/盒50个AFM探针 | NanoAndMore | ￥31530.24 | 3-4周 |
我要询价 立即购买 |
| 240AC-FG-5 |
|
nanoandmore/240AC-FG/240AC-FG-5/盒5个AFM探针 | NanoAndMore | ￥13200.00 | 3-4周 |
我要询价 立即购买 |
| HQ:NSC36/tipless/NoAl-100 |
|
nanoandmore/HQ:NSC36/tipless/No Al/HQ:NSC36/tipless/No Al-100/Box of 100 AFM Probes | NanoAndMore | ￥18360.00 | 3-4周 |
我要询价 立即购买 |
| TipCheck |
|
NanoAndMore/Tipcheck AFM Tip Characterizer Calibration Standard - NanoAndMore/TipCheck | NanoAndMore | ￥2160.00 | 3-4周 |
我要询价 立即购买 |
